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其他書名
Materials Analysis by Mass Spectrometry
出版IM Publications, 2013
ISBN19067151739781906715175
URLhttp://books.google.com.hk/books?id=yFUHFEipgcYC&hl=&source=gbs_api
EBookSAMPLE
註釋Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive