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Electron Microscopy and Analysis, Third Edition
Peter J. GoodhewJohn HumphreysRichard Beanland
出版CRC Press, 2000-11-30
主題Technology & Engineering / Materials ScienceTechnology & Engineering / Lasers & PhotonicsTechnology & Engineering / Imaging SystemsScience / Physics / Optics & LightComputers / Optical Data Processing
ISBN07484096889780748409686
URLhttp://books.google.com.hk/books?id=zuxPIVmGLGsC&hl=&source=gbs_api
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註釋Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.