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X-ray Diffraction at Elevated Temperatures
Deborah D. L. Chung
其他書名
A Method for in Situ Process Analysis
出版VCH, 1993
主題Science / Chemistry / GeneralScience / Physics / Optics & LightTechnology & Engineering / Industrial Technology
ISBN08957374509780895737458
URLhttp://books.google.com.hk/books?id=B7vvAAAAMAAJ&hl=&source=gbs_api
註釋A textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR